Call Us :   (403) 444-8181
  • Language:

  Refraction  

Statics Solutions – Refraction Methods

Refractor Model Profiles

flatirons1

Geo-X offers multiple methods for solving near-surface modeling challenges. Each unique method has distinctive strengths to address data variability and near surface characteristics. Solve a wide range of near surface problems with a variety of approaches:

  • Delay time layer-based model
  • 3D Eikonal tomography
  • Layered tomography
  • 2D-specific algorithms

Each technique provides critical interactivity to help you you make essential interpretive decisions and optimize interpretive steps. Interactive tools assist with refractor selection, weathering velocity, refractor smoothing, statics computation and datum selection. We’ve added visualization so you can compare solutions with corrected data in multiple perspective views. You review the statics solution to quickly understand and interpret results, moving through the seismic data workflow with confidence. Designed for 2D or 3D data, this quality control includes the ability to generate CMP stacks along any user-defined profile pulled from a 3D volume.

Shot Record with Tomographic Solution Applied
flatirons2

Eikonal Tomography

The tomography technique is the most recent innovation in refraction solutions. With a powerful node-based modeling approach, the Eikonal solution delivers quick run time and accurate results.

Stacking velocity along a profile
flatirons3

Refractor anisotropy with azimuthal behavior.

Geo-X uses a model-free approach to correct anisotropy regardless of origin. Whether the sine wave behavior is caused by anisotropy in refractor velocity, the layers above the refractor, by near surface geology, or a combination, the refraction technique removes the effects, insuring that subsequent processing steps are more accurate.

Refractor anisotropy with azimuthal behavior
flatirons4